In addition to testing the adaptability and the characteristics of the product had been changed under the general conditions of temperature and humidity combination (High-low temperature & storage, temperature cycling, high temperature and high humidity or moisture condensation test) by simulatable products, low humidity and constant temperature-humidity test chamber can also test whether the crazing and breakage of the product would happen under the conditions of low temperature and low humidity, high temperature and low humidity, high temperature and high humidity, low temperature and high humidity. Further more, the static content in air under the low humidity condition is many time more than the general condition, and it is said that most damage of the electronic components is caused by static.
Meeting the requirements of international specification test (IEC, JIS. JB, MIL...) to ensure the consistency of international measurement programs (including testing procedures, conditions and methods) to avoid cognitive differences and reduces the measurement uncertainties.

Test specification:

• a.Specification required for condensation and non-condensation tests can be performed;
• b.Technology of temperature and humidity synchronization slope control of test sample non-condensation test.
• c.Drying phase test conditions before condensation test can be performed.

Test Condition:

• 5% RH: 10℃/5% RH, 20℃/5% RH, 50℃/5% RH;
• 10% RH: 10℃/10% RH, 15℃/10% RH, 25℃/10% RH, 30℃/10% RH, 65℃/10% RH;
• 15% RH: 10℃/15% RH;
• 20% RH: 20℃/20% RH, 65℃/20% RH, 75℃/20% RH, 85℃/20% RH;
• 40% RH: 25℃/40% RH;
• 90% RH: 65℃/90% RH.

Specification: